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semiconductor device for memory, logic, and neuromorphic computing application.
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Chae Eun Kim#, Namju Kim#, Suk-Kang Sung, Byung Chul Jang*, IEEE Transactions on Eelectron Devices, (under revision) (2026) [IF:3.6]
Jaejoong Jeong, Yeeun Kim, Youngkeun Park, Yeong Kwon Kim, Byung Chul Jang, Jong Kyung Park, Byung Jin Cho*, IEEE Transactions on Electron Devices, (2026) [IF:3.6]
Hyeun Woo Shin#, Namju Kim#, Suk-Kang Sung, Byung Chul Jang*, IEEE Transactions on Device and Materials Reliability, 26, 328-333, (2026) [IF:2.7]
Hyeonho Gu#, Haksoon Jung#, Minho Park, Hyeonjin Lee, Ae Rim Choi, Il-Kwon Oh, Yanfeng Zhao, Byungjo Kim, Jungsik Kim, Byung Chul Jang, Yongwoo Lee, Jimin Kwon, IEEE Electron Device Letters, (2026) [IF:4.6]
Changyoung Kim#, Namju Kim#, Seongkweon Kang, Chang Yong Park, Sang-Min Lee, Cheolhwa Jang, Ji-Sang Park, Byung Chul Jang*, Sungjoo Lee*, Advanced Materials, (2026) [IF:29.1]
Juhyung Seo#, Seungme Kang#, Chaehyun Kim#, Taehyun Park#, Youngwoo Yoo, Yeong Kwon Kim, Wonjun Shin, Byung Chul Jang*, Young-Joon Kim*, Hocheon Yoo*, Advanced Materials, (2026) [IF:29.1]
Seongjun Kim#, Jeong-Ick Cho#, Sungsoo Lee#, Yoonchul Shin, Je-Jun Lee, Sanghyun Lee, Kwanghee Ko, Juncheol Kang, Junseo Lee, Matthew T. Flavin, Dong-Ho Kang, Byung Chul Jang, Ji-Hoon Ahn, Yoonmyung Lee, Sang Min Won*, Jin-Hong Park*, Seyong Oh*, Advanced Materials, (2026) [IF:29.1]
Daeun Kim#, Jaehyoung Ko#, Namju Kim#, Quynh H. Nguyen, Hoyeon Lee, Joohwan Eo, Seongeon Jin, Ji Eon Kwon, Seung-Yeol Jeon, Youngdo Jeong, Dongseok Kwon, Sung Gap Im, Sanghan Lee*, Byung Chul Jang*, Yongho Joo*, Advanced Functional Materials, e16603 (2025) [IF:19.0]
Kisu Kim, Yuhyun Moon, Yeong Kwon Kim, Sangho Shin, J. Cheng Bi, Joo Yun Jung, Byung Chul Jang*, Byeong-Kwon Ju*, Communications Materials, 6, 270 (2025) [IF:9.6]
Hyejin Yoon#, Soeun Park#, Yeong Kwon Kim#, Juhwan Baek, Ki Han Kim, Jeongeun Choi, Seongil Yun, Hyeonchang Son, Jeongeun Choi, Byung Chul Jang*, Dong-Ho Kang*, Advanced Functional Materials, 36, e19498, (2026) [IF:19.9] [Inside Front Cover]
Jongmin Noh#, Young Kwon Kim#, Seongkweon Kang, Sang-Min Lee, Byung Chul Jang*, Sungjoo Lee*, Small, 21, e05649 (2025) [IF:12.1]
Sangmin Lee#, Yeong Kwon Kim#, Byung Chul Jang*, Sungjoo Lee*, ACS Nano, 19, 29028−29048 (2025) [IF:16.0]
Ji In Kim#, Yeong Kwon Kim#, Byung Chul Jang*, Min Ju Kim*, ACS Applied Electronic Materials, 7, 5451-5462 (2025) [IF:4.4]
Sungpyo Baek#, Young Kwon Kim#, Sang-Min Lee, HaeJu Choi, Ji-Sang Park, Byung Chul Jang*, and Sungjoo Lee*, Advanced Materials, 37, e06921 (2025) [IF:26.8]
Ki Han Kim#, Ju Han Park#, Khang June Lee#, Ji-Won Seo, Yeong Kwon Kim, Junhwan Choi, Min-Jae Seo*, and Byung Chul Jang*, Advanced Science, 12, e01926 (2025) [IF:14.3]
Namju Kim#, Jun-Hwe Cha#, Yeong Kwon Kim#, Inyong Kim, Minkyu Jeong, Junhwan Choi, and Byung Chul Jang*, Device [Cell press's sister journal], 3, 100908 (2025)
Si Heon Lim, Geunwoo Kim, Sungjin Cho, Yeong Kwon Kim, Eun Bee Ko, Seon Yeon Choi, Jung A Heo, Daegun Kim, Hocheon Yoo, So‐Yeon Lee, YongJoo Kim, Pil‐Ryung Cha, Dong Yun Lee, Sunghun Lee, Byung Chul Jang, Yeonhoo Kim, Hyun Ho Kim*, Advanced Materials, 37, 2418407, (2025) [IF:26.8]
Taehyun Park#, Juhyung Seo#, Namju Kim#, Chaehyun Kim#, Yeong Jae Kim, Hyeonghun Kim, Hyun Ho Kim, Seyong Oh, Dong Chan Kim, Donghee Son, Jaehyun Hur*, Young-Joon Kim*, Byung Chul Jang*, Hocheon Yoo*, Advanced Materials, 37, 2419579, (2025) [IF:26.8] [Inside Front Cover]
Hyeonji Lee#, Jungyeop Oh#, Wonbae Ahn, Mingu Kang, Seohak Park, Hyunmin Kim, Seungsun Yoo, Byung Chul Jang, Sung-Yool Choi, Advanced Functional Materials, 35, 2416811, (2024) [IF:18.5]
Juhyung Seo#, Seungme Kang#, Divake Kumar#, Wonjun Shin#, Jinill Cho, Taesung Kim, Yeongkwon Kim, Byung Chul Jang, Amit R. Trivedi, Hocheon Yoo, Advanced Functional Materials, 35, 2411348, (2024) [IF:18.5]
Ki Han Kim#, Namju Kim#, Yeong Kwon Kim#, Hee Seung Kim, Han Byeol Oh, Chae Eun Kim, Hyeun Woo Shin, Myeong Gi Kim, Won Jun Choi, Byung Chul Jang*, Device [Cell press's sister journal], 3, 100682 (2025)
Haeju Choi, Sungpyo Baek, Hanggyo Jung, Taeho Kang, Sangmin Lee, Jongwook Jeon, Byung Chul Jang*, Sungjoo Lee*, Advanced Materials, 37, 2406970 (2025) [IF:26.8]
Jaehyoung Ko, Daeun Kim, Quynh H. Nguyen, Changhyeon Lee, Namju Kim, Byung Chul Jang*, Sung Gap Im*, Yongho Joo*, Science Advances, 10, eadp0778 (2024) [IF:11.7]
Yunchae Jeon#, Gyeongho Lee#, Yeong Jae Kim, Byung Chul Jang*, Hocheon Yoo*, Advanced Functional Materials, 34, 24095780(2024) [IF:18.5]
Wangmyung Choi#, Jihyun Shin#, Yeong Jae Kim, Jaehyun Hur, Byung Chul Jang*, Hocheon Yoo*, Advanced Materials, 36, 2312831 (2024) [IF: 27.4] [Inside Front Cover]
Yeong Kwon Kim#, Sangyong Park#, Junhwan Choi, Hamin Park*, Byung Chul Jang*, Advanced Functional Materials, 36, 2405670 (2024) [IF:18.5]
Gunhoo Woo#, Hyeong-U Kim#, Byung Chul Jang#, Muhammad Naqi, Seongin Hong, Arindam Bala, Seunghun Kang, Yunseok Kim, Sunkook kim, Taesung Kim, Jae-Joon Kim*, Hocheon Yoo*, Journal of Materials Chemistry C, 12, 6350-6358 (2024) [IF:5.7]
Byung Chul Jang#, Hyejeong Seong#, Sung Kyu Kim, Jong Yun Kim, Beom Jun Koo, Junhwan Choi, Sang Yoon Yang, Sung Gap Im*, Sung-Yool Choi*, ACS Applied Materials & Interfaces, 8, 12951-12958 (2016) [IF:10.383]
Jun-Hwe Cha, Sang Yoon Yang, Jungyeop Oh, Shinhyun Choi, Sangsu Park, Byung Chul Jang, Wonbae Ahn, Sung-Yool Choi, Nanoscale, 12, 14301-14930 (2020) [IF:6.307] [Inside Front Cover]
Hagyoul Bae, Daewon Kim, Myungsoo Seo, Ik Kyeong Jin, Seung‐Bae Jeon, Hye Moon Lee, Soo‐Ho Jung, Byung Chul Jang, Gyeongho Son, Kyoungsik Yu, Sung‐Yool Choi, Yang‐Kyu Choi, Advanced Materials Technologies, 4, 1900151 (2019) [IF:8.856]
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2026.05
석사과정 신현우 학생의 삼성전자와의 공동 연구로 "Investigation of Buried Channel Array Transistor as a Scalable High-Voltage Pass Transistor for 3-D NAND Flash Memory" 제목으로 IEEE Transactions on Device and Materials Reliab…
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2026.05
산업기술개발에 대한 기획, 평가, 관리 등의 사업을 수행함으로써 산업기술의 혁신을 통한 산업경쟁력과 국가혁신역량 제고에 기여할 목적으로 설립된 대한민국 산업통상부 산하 위탁집행형 공공기관인 한국산업기술기획평가원으로의 오한별 석사의 취업을 축하합니다.
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2026.05
IEEE IRPS는 반도체 소자, 공정과 반도체 IC의 reliability technology 및 신뢰성 modeling에 관한 세계 최대의 국제 학회입니다. 박사과정 김남주 학생과 석사과정 신현우 학생의 공동 1저자로 기여한 "Scalable High-Voltage Pass Transistor Structures: Physics-based and V…
Hyejin Yoon#, Soeun Park#, Yeong Kwon Kim#, Juhwan Baek, Ki Han Kim, Jeongeun Choi, Seongil Yun, Hyeonchang Son, Jeongeun Choi, Byung Chul Jang*, Dong-Ho Kang*, Advanced Functional Materials, 36, e19498, (2026) [IF:19.0] [Inside Front Cover]
Ki Han Kim, Woo Cheol Shin, Chae Eun Kim, Yoohyun Noh, Ju-Yeob Lee, Sang Hyun Oh, Byung Chul Jang*, IEEE International Reliability Physics Symposium (IRPS), Tucson, USA, (2026)